Seiko Instruments Inc.
検索 ホームEnglishChinese
エスアイアイ・ナノテクノロジー株式会社
新着情報 イベント 製品情報 アプリケーション 販売チャネル 企業情報 お問い合わせ
製品情報
製品一覧
熱分析(DSC, TG/DTA, TMA, DMA)
SPM(走査型プローブ顕微鏡)
走査型プローブ顕微鏡(SPM)製品ラインナップ
スペシャルコンテンツ
取り扱いカンチレバー一覧表
走査型プローブ顕微鏡(SPM)の歴史
走査型プローブ顕微鏡(SPM)の原理解説
走査型プローブ顕微鏡(SPM)のアプリケーションデータ
走査型プローブ顕微鏡(SPM)のデータギャラリー
走査型プローブ顕微鏡(SPM)の国際学会発表ポスター
走査型プローブ顕微鏡(SPM)の参考文献リスト
走査型プローブ顕微鏡(SPM)の用語集
走査型プローブ顕微鏡(SPM)セミナーレビュー
集束イオンビーム(FIB)/走査イオン顕微鏡
ICP発光分光・質量分析(ICP-OES/ICP-MS)
デバイス観察/フォトマスクリペア
蛍光X線分析
膜厚測定
透過電子顕微鏡/走査電子顕微鏡(TEM/SEM)
半導体製造支援ソフトウェア(MDP)
X線検出器
プレクリニカル・イメージングシステム
価格問い合わせ
価格問い合わせフォーム
消耗品価格表
予算申請用カタログ
販売チャネル
製品の安全点検について
試験所

 参考文献


3. 参考文献

Abel, M. R., T. L. Wright, S. Graham, and W. P. King. "Thermal Metrology of Silicon Microstructures using Raman Microscopy," IEEE Transactions on Components and Packaging Technology, 2007.
Gray, T., Killgore, J., Luo, J., Jen, A., Overney, R.,” Molecular mobility and transitions in complex organic systems studied by shear force microscopy” Nanotechnology 18, 044009 (2007)
Chui, B. W., L. Aeschimann, T. Akiyama, U. Staufer, N.F. DeRooij, J. Lee, F. Goericke, W. P. King, and P. Vettiger. "Advanced Temperature Compensation for Piezoresistive Cantilevers using 45-Degree Angle Resistor Pairs," Review of Scientific Instruments, 2007.
Gurrum, S. P., Y. K. Joshi, W. P. King, K. Ramakrishna, and M. Gall. "A Compact Approach to On-Chip Interconnect Heat Conduction Modeling Using the Finite Element Method," ASME Journal of Electronic Packaging, 2007.
Harding, L., W. P. King, D. Q. M. Craig, and M. Reading. "Nanoscale Imaging of Partially Amorphous Materials using Local Thermomechanical Analysis and Heated Tip Pulsed Force Mode AFM," Pharmaceuticals Research (in press), 2007.
Kim, K. J., K. Park, J. Lee, Z. M. Zhang, and W. P. King. "Nanotopographical Imaging using a Heated Atomic Force Microscope Cantilever Probe," Sensors and Actuators, 2007.
King, W. P. and K. E. Goodson. "Thermomechanical Formation of Nanoscale Polymer Indents with a Heated Silicon Tip," Journal of Heat Transfer, 2007.
Nelson, B. A. and W. P. King. "Thermal Analysis with Nanoscale Spatial Resolution using Heated Probe Tips," Review of Scientific Instruments (Republished online in the Virtual Journal of Nanoscience & Nanotechnology 15, 2007), 78, 23702, 2007.
Nelson, B. A., and W. P. King. "Temperature Calibration of Heated Silicon Atomic Force Microscope Cantilevers," Sensors and Actuators A, 2007.
Park, K., J. Lee, Z. M. Zhang, and W. P. King. "Frequency-Dependant Electrical and Thermal Response of Heated Microcantilevers," Journal of Microelectromechanical Systems, 2007.
Park, K., J. Lee, Z. M. Zhang, and W. P. King. "Topography Imaging using a Heated Atomic Force Microscope Cantilever in Tapping Mode," Review of Scientific Instruments, 2007.
Park, K., S. Basu, W.P. King, and Z.M. Zhang. "Performance Analysis of Near-Field Thermophotovoltaic Devices Considering Absorption Distribution," Journal of Quantitative Spectroscopy and Radiative Transfer (in press), 2007.
Remmert, J. L., Y. Wu, M. A. Shannon, and W. P. King. "Contact Potential Measurement using a Heated Atomic Force Microscope Cantilever Tip," Applied Physics Letters (in press), 2007.
Rowland, H. D., A. C. Sun, P. R. Schunk, G. L. W. Cross, and W. P. King. "Predicting Polymer Flow during High Temperature Atomic Force Microscope Nanoindentation," Macromolecules (in press), 2007.
Saxena, S., Y. Hua, C. L. Henderson, and W. P King. "Nanoscale Thermal Lithography by Local Polymer Decomposition Using a Heated Atomic Force Microscope Cantilever Tip ," Journal of Microlithography, Microfabrication, and Microsystems, 2007.
zoszkiewicz, R., T. Okada, S. C. Jones, T.-D. Li, W. P. King, S. R. Marder, and E. Riedo. "High-Speed, Thermochemical Nanolithography with Sub-15 nm Resolution," Nano Letters, 2007. Wornyo, E., K. Gall, F. Yang, and W. P. King. "Nanoindentation of Shape Memory Polymer Networks," Polymer, 48, 3213-3225, 2007.
Yang, F., E. Wornyo, K. Gall, and W. P. King. "Nanoscale Strain Storage in a Shape Memory Polymer using a Heated Probe Tip," Nanotechnology, 18, 285302, 2007.
Yang, F., E. Wornyo, K. Gall, and W. P. King. "Thermal Formation and Recovery of Nanoindents in a Shape Memory Polymer Studied using a Heated Tip," Scanning (in press), 2007.
Allen, A., E. O. Sunden, A. Cannon, S. Graham, and W. P. King. "Nanomaterial Transfer using Hot Embossing for Flexible Electronic Devices," Applied Physics Letters (Republished online in the Virtual Journal of Nanoscience & Nanotechnology 13:9, 2006), 88, 83112, 2006.
Bakbak, S., P. K. Leech, B. E. Carson, S. Saxena, W. P. King, and U. H. F. Bunz. "1,3-Dioolar Cycloaddition for the Generation of Nanostructured Semiconductors by Heated Probe Tips," Macromolecules, 39, 6793-6795, 2006.
Cannon, A. H., A. C. Allen, S. Graham, and W. P. King. "Molding Ceramic Microstructures on Flat and Curved Surfaces with and without Embedded Carbon Nanotubes," Journal of Micromechanics and Microengineering, 16, 2254-2563, 2006.
King, W. P., S. Saxena, B. A. Nelson, and B. Weeks. "Nanoscale Thermal Analysis of an Energetic Material," Nano Letters, 6, 2145-2149, 2006.
Lee, J., T. L. Wright, T. Beecham, B. A. Nelson, S. Graham, W. P. King. "Electrical, Thermal, and Mechanical Characterization of Heated Microcantilevers," Journal of Microelectromechanical Systems , 15, 1644-1645, 2006.
Sunden, E. O., J. Lee, T. L. Wright, W. P. King, and S. Graham. "Room Temperature Chemical Vapor Deposition and Mass Detection on a Heated Atomic Force Microscope Cantilever," Applied Physics Letters (Republished online in the Virtual Journal of Nanoscience & Nanotechnology 13:3, 2006), 88, 33107, 2006.
Masters, N., W. Ye, and W. P. King. "The Impact of Sub-Continuum Gas Conduction on the Sensitivity of Heated Atomic Force Microscope Cantilevers," Physics of Fluids (Republished online in the Virtual Journal of Nanoscience & Nanotechnology 12: 16, 2005), 17, 100615, 2005. Van Assche, G., Ghanem, A., Lhost, O., Van Mele, B., “Through-thickness analysis of the skin layer thickness of multi-layered biaxially-oriented polypropylene films by micro-thermal analysis” Polymer 46 (2005) 7132-7139
King, W. P., T. W. Kenny, and K. E. Goodson. "Comparison of Thermal and Piezoresistive Sensing Approaches for Atomic Force Microscopy Topography Measurements," Applied Physics Letters, 25, 2086-2088, 2004.
Poggi, M. A., E. D. Gadsby, L. A. Bottomley, W. P. King, E. Oroudjev, and H. Hansma. "Scanning Probe Microscopy," Analytical Chemistry, 76, 3432-3446, 2004
an Assche, G., Van Mele, B., "Interphase formation in model composites studied by micro-thermal analysis," Polymer 43 (2002) 4605-4610
"A high-resolution multiple analysis approach using near-field thermal probes", A Hammiche, M Reading, D Grandy, D M Price, M J German, L Bozec, J M R Weaver, P Stopford, G Mills and H M Pollock, in: "Scanning tunnelling microscopy / spectroscopy and related techniques: 12th int. conf.", ed. P M Koenraad and M Kemerink (American Institute of Physics conf. Proc. 696, Melville, USA), pp. 369-376 (2003).
R Smallwood, P Metherall, D Hose, M Delves, H Pollock, A Hammiche, C Hodges, V Mathot and P Willcocks, "Tomographic imaging and scanning thermal microscopy: thermal impedance tomography", Thermochimica Acta 385, 19-32 (2002).
(Topical review): Micro-thermal analysis: techniques and applications, H. M. Pollock and A. Hammiche, J Phys D: Appl Phys 34, R23-R53 (2001).
Micro-thermal analysis and evolved gas analysis, D M Price, M Reading, T J Lever, A Hammiche and H M Pollock, Thermochimica Acta 367-8, 195-202 (2001), corrected in 376 (2001) 95-97. Micro-thermal analysis of polymers: current capabilities and future prospects, M. Reading, D. M. Price, D B Grandy, R M Smith, L Bozec, M Conroy, A. Hammiche & H. M. Pollock, Macromolecular Symposia 167, 45-62 (2001).
Micro-Thermal Analysis: scanning thermal microscopy and localised thermal analysis, D. M. Price, M. Reading, A. Hammiche & H. M. Pollock, International Journal of Pharmaceutics 192, 85-96 (1999).
`Localised thermal analysis of a packaging filmA’, Price, D.M.; Reading, M.; Hammiche, A.; Pollock, H. M.; Branch, M. G.; Thermochimica Acta 332, 143-9 (1999).
Two new microscopical variants of thermomechanical modulation for microscopy: SThEM and Dynamic L-TMA (scanning thermal expansion microscopy and dynamic localised thermomechanical analysis), A Hammiche, D M Price, E Dupas, G Mills, A Kulik, M Reading, J M R Weaver, H M Pollock, J Microscopy 199(3), 180-190 (2000).
Highly localised thermal, mechanical and spectroscopic characterisation of polymers using miniaturised thermal probes, A Hammiche, L Bozec, M Conroy, H M Pollock, G Mills, J M R Weaver, D M Price, M Reading, D J Hourston and M Song, Journal of Vacuum Science & Technology B 18(3), 1322-1332 (2000).
Localised evolved gas analysis by micro-thermal analysis, D. M. Price. M. Reading, R. M. Smith, H M Pollock and A Hammiche, J Thermal Analysis and Calorimetry 64, 309-314 (2001). 11. New adventures in thermal analysis, D M Price, M Reading, A Hammiche and H M Pollock, Journal of Thermal Analysis & Calorimetry 60, 723-733 (2000).


Backナノサーマル顕微鏡 nano-TAトップへ

SIIホーム
■ サイトのご利用について   ■ 個人情報保護ポリシー   ■ サイトマップ  
Copyright © 2012 SII NanoTechnology Inc. All Rights Reserved.