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TopProducts > XRF Analysis > SEA6000VX >Feature of SEA6000VX (2)

@Meeting Your Needs for
@High Sensitivity in Micro Areas


Continuous multi-point measurements

Up to 500 points can be set and continuously measured as with an auto-sampler. Measuring large number of samples exhibits tremendous throughput.
Continuous multi-point measurement
Multi-point continuous measurements: Labar savings by setting up to 500 points for auto continuous measuring


Example of RoHS analysis

In a sample that combines multiple substances, measuring can be done by using a micro X-ray beam aimed at a specific spot.
 [Example of Cd analysis in a Cu alloy]
Example of Cd analysis in a Cu alloy
 
 [Cd analysis of harness material]
Cd analysis of harness material


High speed measurement of trace metals in micro-areas

Rapid measurement of trace metals and thin films in microscopic areas.
 

Cd, Pb, Cr
in Brass

Pb in Sn
Cd, Pb, Hg, Br, Cr
in plastic
3mm Square
80sec
40sec
70sec
1.2mm Square
150sec
40sec
80awc
The detection lower limit of Cd is 30ppm and the other elements is 200ppm


Measure Cl concentration in PCB assemblies

To meet halogen-free needs, high sensitivity in microscopic areas is realized in measuring Cl and Br. Since the irradiation method is top-down, pinpoint measurement positioning is possible even on boards that have uneven surfaces.
Measurement example of Cl concentration in PCB assemblies


Microscopic area coating thickness measurements

The SEA6000VX is capable of coating thickness measurements typical of the SFT series including coating thickness measurement of ultra-thin Au films. Analysis of hazardous substances such as Pb in plating can be measured simultaneously with coating thickness measurements. For example, possibilities include composition measurement of hazardous substances in Pb-free solder plating, Sn plating of lead frames, and electroless Ni plating.
[Analysis of Sn-Ag/Cu]
Area: 1.2mm square
Film FP method Time: 100 sec (Pb filter)
  30 sec (no filter)
  [Au/Ni/Cu coating thickness]
Area: 0.2mm square
Cal method
Time: 30 seconds
Thick
Comp ratio
Haz Sub
 
Sn-Ag [µm]
Ag [wt%]
Pb[ppm]
1
5.34
2.83
291
2
5.30
2.63
297
3
5.31
2.64
347
4
5.34
2.73
303
5
5.31
2.67
329
6
5.33
2.67
334
7
5.33
2.75
291
8
5.30
2.74
262
9
5.35
2.72
303
10
5.36
2.91
308
AVE.
5.33
2.73
306.5
SD
0.02
0.09
24.6
CV
0.4%
3.2%
8.0%
 
     
 
Au [µm]
Nl [ µm]
1
0.054
5.11
2
0.055
5.11
3
0.054
5.12
4
0.055
5.08
5
0.054
5.10
6
0.055
5.13
7
0.053
5.08
8
0.053
5.09
9
0.054
5.08
10
0.055
5.14
AVE.
0.054
5.14
SD
0.008
0.02
CV
1.5%
0.4%


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