Conventionally, contamination analysis uses a microbeam to irradiate comparitively large contaminants and by observation with unaided eyes or a microscope, but in this case no more than element analysis can be performed.
The SEA6000VX enables detection of an entire sample and contamination less than several tens of µm in size through high sensitivity and by high speed mapping.
Measurement Examples:
• Contaminant analysis of ferrite powder
• Contaminant analysis of Sealing material
• Analysis of metal contaminant in Diamond tools
Pb 1000ppm mapping
Two dimensional mapping of elements at low concentrations is possible by overlapping mapping repetitions, but this requires an enormous amount of time using conventional instruments. With SEA6000VX, 1000ppm level Pb mapping is possible in 30 minutes* by overlapping mapping repetitions. *Time required in the example below. Time may differ with conditions.
Beginning with Pb on internal boards, various mapping images of elements can be obtained without taking apart products with unknown internal structures, such as laptop computers and cell phones. By comparing mapping images of elements obtained by penetrating X-rays, various information can be obtained about the structure and internal components.
See-through mapping enables you to easily inspect for the existence of targeted elements without disassembling the sample product.
Area integrated spectrum function
An integrated spectrum can be displayed by designating any area of the mapping image. This is because spectral information is held in each pixel. The existence of an element can be determined and simple composition integration is also possible by verifying spectrum for information difficult to identify only from a mapping image.
View video on High-speed Mapping 
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