| Name |
Fluorescent
X-ray Coating Thickness Gauge |
| Overview |
SFT9550 is equipped with a stage supporting large specimens of up to 400(X) x 300(Y) x 45(Z) mm, in response to the needs for the measurement of large printed circuit boards or automatic measurement of several specimens. Like the SFT9500, the SFT9550 can perform mapping of environmentally restricted substances as well as high precision measurement of thin plating. |
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| Features |
1. Measurement of large specimen Loaded with a large stage, a large specimen (up to 400(X) x300 (Y) x45 (Z) mm), which could not be measured conventionally without having it cut, can be measured as it is. Moreover, many small specimens can be arranged on the stage and automatically measured continuously.
2. Measurement of thin plantings/multi-layered plantings The thickness of each layer for multi-layers (Au/Pd/Ni/Cu or Au/Ni/Ti/Si) in the field of semiconductors and electronic parts can be measured simultaneously at the level of several nanometers. With the high-intensity of the micro beam (diameter of 0.1mm) by adopting an X-ray collecting system (capillary), the X-ray is detected with the intensity of up to 50 times compared with the conventional models, and the thin plating is measured with high precision. Measurements of micro spots and thin platings, such as lead frame, connector and flexible substrate, etc., can be performed.
3. Mapping function The mapping function using the micro beam makes it possible to easily and quickly observe the distribution of the plating thickness of the sample, as well as the distribution of specific elements therein. In particular, it is effective to check a lead-free soldering part in the mounting board.
4. Analytical function Equipped with "Vortex", a liquid nitrogen-free semiconductor detector with a high counting rate and high resolution, the qualitative and quantitative analysis of an unknown specimen can be conducted. Furthermore, a foreign body can be analyzed by the micro beam.
5. Data editing functions Microsoft Excel and Microsoft Word are installed as standard. Microsoft Excel is equipped with statistical processing functions that enable statistical processing of measured data, average values, maximum and minimum values, C.V. values, Cpk, etc. Microsoft Word makes it possible to easily create reports on the results of measurements, including the sample image. |
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