| Name |
High Performance Fluorescent X-ray Coating Thickness Gauge |
| Overview |
Advanced x-ray microfocus technology has achieved high brilliance beam with an actual beam size of less than 0.1mm in diameter. Consequently, SFT9500 Series is capable of measurements of micro spots and thin film applications, such as lead frames, connectors, and flexible PCBs, that are difficult to measure with conventional models due to insufficient fluorescent X-ray intensity from measurement samples. also suitable for RoHS&ELV analysis. |
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