| Elements Measured |
Atomic Numbers 22 (Ti) to 83 (Bi) |
| X-Ray Tube |
Tube voltage: 50kV Current: 1.5mA |
| Detector |
Semiconductor detector / Proportional counter |
| Sample Observation |
CCD Camera (with zoom) |
| Focus |
Laser Pointer |
| Filter |
Powered selector (Primary: Mo, Secondary: Co) |
| X-ray Station |
PC, 17-inch CRT |
| Printer |
Inkjet Printer |
Film Thickness Measurement Software |
Thin-Film FP Method, Calibration Curve Method |
Composition Measurement Software |
Bulk FP Method |
| Measurement Functions |
Automatic Measurement, Center Search, Image Processing |
| Correction Functions |
Material Correction, Known Sample Correction |
| Qualitative Functions |
KL Marker |
| Statistical Analysis |
Microsoft Excel installed |
| Report Creation |
Microsoft Word installed |
| Safety Mechanisms |
Interlocking sample door Sample collision prevention mechanism Device diagnostics mechanism |
| Power Source |
100V 15A |
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