Type SFT9400 SFT9450 SFT9455 Elements Atomic No. 22(Ti) to 83(Bi) Atomic No. 21 or less can be measured by the absorption method X-ray source Small Air-cooled high power X-ray tube (Mo target, Be window) Voltage: 50kV Current: 1.5mA Detector Proportional Counter and Semiconductor Detector (No LN2required) Collimator Round: 0.015, 0.05, 0.1, 0.2mm Options: Rectangular 50 x 50µm, 25 x 300µm, 25 x 400µm Sample Observation CCD camera with optical zoom, halogen light Sample image focus Laser Pointer Filter Primary filter: Mo, automatic switching Sample Stage (Stage size ) (Traveling ) 640（W) x 810(D) x 900（H）mm X:220mm, Y:150mm, Z:150mm 930（W) x 860(D) x 900（H）mm X:400mm, Y:300mm, Z:50mm 680（W) x 810(D) x 900（H）mm X:700mm, Y:600mm, Z:15mm Controller Desktop Computer with 19 inch LCD monitor Application Software Thin Film FP (All types of thin films: Max 5 layers,10 elements per layer), Calibration, Bulk FP method (material composition analysis) Data Process Microsoft® Excel, Microsoft® Word Safety Functions: Sample door interlock, Sample crash prevention mechanism, Device diagnostics mechanism Options: • Coating solution analysis (Bulk Calibration) • Spectrum matching software (Material ID) • Mapping (Intensity surface analysis multi point display) software