| Type |
SFT9200 |
SFT9250 |
SFT9255 |
| Elements |
Atomic No. 22(Ti) to 83(Bi)
Atomic No. 21 or less can be measured by the absorption method |
| X-ray source |
Small Air-cooled X-ray tube (Be window)
Voltage: 45kV
Current: 1mA |
| Detector |
Proportional Counter |
| Collimator |
Round: 0.1, 0.2, 0.3mm
Rectangular: 0.2 x 0.05, 0.05 x 0.2mm
Options: Round 25, 50µm Rectangular 25 x 200µm |
| Sample Observation |
CCD camera |
| Sample image focus |
Laser Pointer |
| Filter |
Primary filter: Al, automatic switching
Secondary filter: Co, automatic switching |
| Sample Stage |
(Stage size ) |
| (Traveling ) |
|
640(W) x 810D) x 900(H)mm X:220mm, Y:150mm, Z:150mm
|
930(W) x 860D) x 900(H)mm X:400mm, Y:300mm, Z:50mm |
680(W) x 810D) x 900(H)mm X:700mm, Y:600mm, Z:15mm |
| Controller |
Desktop Computer with 19 inch LCD monitor |
| Application Software |
Thin Film FP (All types of thin films: Max 5 layers,10 elements per layer), Calibration |
| Data Process |
Microsoft® Excel, Microsoft® Word |
| Safety Functions: |
Sample door interlock, Crash protection function |
| Options: |
• Coating solution analysis (Bulk Calibration)
• Bulk FP method (Material component analysis)
• Spectrum matching software (Material ID)
• Mapping (Intensity surface analysis multi point display) software |