| Elements |
Atomic nos. 12 (Mg) to 92 (U)
*Atomic nos. when using helium purge 11 (Na) to 92 (U) |
| Sample State |
Solid / Powder / Liquid |
| X-ray source |
Air-cooled X-ray tube (W target)
Voltage: 15kV, 30kV, 40kV, 50kV
Current: 20 to 1000uA |
| X-ray direction |
Top-down Irradiation |
| Detector |
Vortex Si semiconductor detector (No liquid nitrogen required) |
| Analysis area (beam size) |
Square 0.2mm, 0.5mm, 1.2mm, 3mm
Electric switching |
| Sample Observation |
High resolution CCD camera, 2 system |
| Chamber |
580 (W) x 450 (D) X 150 (H) mm
Both point analysis and mapping for entire 250 (X) X 200 (Y) mm |
| Filter |
6 mode automatic switching |
| Controller |
Desktop PC and 19" LCD monitor |
| Mapping functions |
Align with sample image, Area integrated spectral display, Quantitative integrated function |
| Qualitative functions |
Spectrum measurement, Auto-ID, Comparison display |
| Quantitative functions |
Bulk CAL, Bulk FP, Film CAL, Film FP |
| Data Process |
Microsoft® Excel, Microsoft® Word |
| Safety functions |
Door interlock, Crash protection, Instrument seld-diagnosis |
| Power requirements (Electric box included) |
AC100V to 240V ±10%, 750VA max. |
| |
• Helium Purge
• Joystick Controller
• Signal Tower
• Dual Monitor
• Sample Holder
• Sample Setting Film
• Printer
• HSEASY (Precision control software) |