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Top >  Products > Scanning Probe Microscope (SPM) > Descriptions > History & Development of SPM (2)

 Scanning Probe Microscope (SPM)

Basic Principles
   

1. STM (Scanning Tunneling Microscope)

Surface electron state/shape observation
Surface electron state/shape observation


2. STM Principle

STM Pronciple
STM Principle


3. AFM (Contact Mode)

Basic of form observation
Basic of form observation


4. AFM Principle

AFM Principle
AFM Principle


5.DFM (Dynamic Force Mode)

Measurement mode suitable for various samples
Measurement mode suitable for various samples


6. DFM Principle.

Structure of equipment
Structure of equipment

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