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Scanning
Probe Microscope (SPM) |
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Basic Principles |
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1. STM (Scanning
Tunneling Microscope)
Surface electron state/shape observation
2. STM Principle
STM Principle
3. AFM (Contact Mode)
Basic of form observation
4. AFM Principle
AFM Principle
5.DFM (Dynamic Force Mode)
Measurement mode suitable for various samples
6. DFM Principle.
Structure of equipment
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