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 Scanning Probe Microscope (SPM)

   

Application

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Scanning Probe Microscope
NPX No.05
Thermal Printer Head & Paper (Nanopics) Thermal Printer Head & Paper (Nanopics)
NPX No.08
Aluminum Circuit Board Polishing (Nanopics) Aluminum Circuit Board Polishing (Nanopics)
NPX No.09
Grinding / Polishing Surface Shape Evaluation (Nanopics) Grinding / Polishing Surface Shape Evaluation (Nanopics)
NPX No.11
Thin Film Hardness Scale Indentation (Nanopics) Thin Film Hardness Scale Indentation (Nanopics)
NPX No.12
Disparity in Sueface Shape Due To Different Metal Dressing Process Conditions - Ball Bearing Groove - (Nanopics) Disparity in Sueface Shape Due To Different Metal Dressing Process Conditions - Ball Bearing Groove - (Nanopics)
NPX No.19
Liquid Crystal Display Production Process Evaluation (Nanopics) Liquid Crystal Display Production Process Evaluation (Nanopics)
NPX No.20
Processing Surface Evalution Methods in Ultra-Precise Processing (Nanopics) Processing Surface Evalution Methods in Ultra-Precise Processing (Nanopics)
NPX No.21
Surface Roughness of Pb-Free Solder Plating (Nanopics) Surface Roughness of Pb-Free Solder Plating (Nanopics)

Principle

NPX No.16

Thin Film Evaluation Using Optional Software (Nanopics) Thin Film Evaluation Using Optional Software (Nanopics)

Biology
NPX No.14
Cuticle Shape Observation on Human hair and Sheep Wool (Nanopics) Cuticle Shape Observation on Human hair and Sheep Wool (Nanopics)

Polymer
SPI No.42
Observation of Polypropylene Crystal Lamellae with SPM Observation of Polypropylene Crystal Lamellae with SPM
NPX No.04
Poriymind Surface Treatment Evalution (Nanopics) Poriymind Surface Treatment Evalution (Nanopics)

Magnetism
SPI No.29
Magnetic Force Microscope(MFM) Measurement with Phase Detection Method Magnetic Force Microscope(MFM) Measurement with Phase Detection Method
SPI No.50
MFM analysis of magnetization process in CoPt dot-array MFM analysis of magnetization process in CoPt dot-array
  Applications of High-Resolution MFM System with Low Moment Probe and Q-control in a Vacuum Applications of High-Resolution MFM System with Low Moment Probe and Q-control in a Vacuum


Scanning Probe Microscope Top
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