Standard Options X/Y scan voltage ±200V/18bit   Z scan voltage ±200V/21bit   Simultaneous measure 8192 x 1024 x 4 screen 8192 x 8192 x 4 screen Scan routation ±180 (0.1° step)   Rectangle scan 1:1, 2:1, 4:1, 8:1, 16:1, 32:1, 64:1, 128:1, 256:1, 512:1, 1024:1 2048:1, 4096:1, 8192:1 Function • Auto gain control • Zscan limiter • Closed loops control • Active Q function • SIS mode Software • Image menu • Image overlap function (Shape/Physical property) • 2 sgnal force curve measurement • Auto measurement recipe function • Data analysis batch process function •3D display function • Surface roughness analysis (Rm, Ra, depth, surface area etc.) • Cross section analysis, Average cross section analysis • Multiple function simultaneous cross section analysis (supports 2 to 4 screens) • Supports surface roughness JIS standard (JIS R 1683: 2007) • Probe evaluation function • Line editor function • Auto cross section profule analysis (groove width, pitch, angle analysis) • Motphology filter function • Expansion particle analysis (particle diameter, particle surface, number of particles, etc.) OS Windows® XP