Standards Options Detection system Low coherent optic lever method 4 part phase detection system   Resolution Atomic resolution   Sample size 35mm, thickness 10mm Supports thickness up to 20mm by raising block (option) Scan range Standard: supports 20um x 20um/1.5umH Supports 100um x 100um/15umH Supports 150um x 150um/5umH Supports 110um x 110um/6umH (closed loop control) Positioning microscope   Simple microscope (×200 mag) Optic microscope (×1000 mag) Zoom microscope (×700 mag) Metal microscope (with differential interference)(×2000 mag) Measurement functions AFM (Contact) DFM, PM (Phase) FFM (Friction) MFM (Magnetic force) SIS mode LM-FFM (Traverse vibration friction) VE-AFM/DFM (visco-elasticity) Adhesion (absorption force) CURRENT SSRM (Spread resistance） SNDM (Conductivity) PRM (piezo-electric response) KFM (Surface phase) AFM/DFM insolution EC-AFM/STM (Electro-chemical) NanoIndentation (Hardness） Nano-TA (nano-thermal) Option Electro-chemical holder in liquid Schale cell Sealed environment control cell Electro-chemical cell