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Instruments suitable for WEEE/RoHS/ELV analysis

To view detail of each product, click product photo or product name.

[XRF Analyzers]

  new
SEA200 SEA6000VX, HSFinder
High Senditivity XRF Analyzer
The SEA6000VX HS Finder enables control of hazardous substances over entire surfaces and measurement of microscopic points at a specified area. These tasks cannot be done by conventional instruments.
XRF analyzer SEA6000VX
vortex LN2 less Top DPD CMP Map HSeasy RoHS CMA GA Green product
SEA200 SEA1200VX
High Sensitivity Element Monitor
Improved sensitivity is realized by installing a highly sensitive, high resolution detector to handle all types of analysis from RoHS/ELV screening to advanced types of analysis.
XRF analyzer SEA1200VX
vortex LN2 less Bottom DPD HSeasy RoHS GA Green product
SEA200 SEA1000A II
Hazardous Substance Monitor
SEA1000A is a dedicated machine that easily, quickly and non-destructively detects cadmium, lead, mercury and other hazardous substances banned by the enforcement of the RoHS directive. Since a detector needs no liquid nitrogen is installed in this device, it does not require the hassles of periodic refilling, and operates simply with electric power in plants where liquid nitrogen may be in short supply.
  LN2 less Bottom DPD HSeasy RoHS Green product
SEA1000AII
SEA2200A Series SEA2200A Series
Hazardous Substance Monitor
SEA2200A is standard equipped with a compensation software that minimizes effects of the measurement sample's shape, thickness and composition, and as it can quickly and make measurements without preparing samples such as cadmium, lead and other hazardous substances in plastic products, it is useful for inspecting large volumes of goods.
  Bottom HSeasy RoHS GA
SEA2200A Series
SEA5100/5200 SEA5120A
Micro Element Monitor
Qualitative analysis of 50µm diameter micro parts and multiple element simultaneous quantitative analysis. Equipped with x-ray filters, allows measurement of hazardous substances restricted by WEEE and RoHS at high sensitivity. With a sample observation DDC microscope and X-Y-Z auto stage, analysis of microscopic areas and display output of mapping images of each element is possible. Functions are also provided for unknown substance analysis and coating thickness measurement.
  Top Map HSeasy GA
SEA5120A, Micro Element Monitor

[ICP Optical Emission Spectrometers]

  new
SPS7800 Series SPS3500 Series
ICP Optical Emission Spectrometer
High-performance and high-function sequential type ICP optical emission spectrometer.
  Sequencial
SPS3500 Series
SPS7800 Series SPS7800 Series
Bench-top Optical Emission Spectrophotometer
A compact bench-top sequential type ICP optical emission spectrometer.
  Sequencial space
SPS7800 Series
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