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Top >  Products > Focused Ion Beam (FIB) > Application

 Focused Ion Beam (FIB)

Application
Read on for observation examples of focused ion beam. (Adobe Reader required)

1.  Fabrication of 3D Nano-structure PDF Download
2.  Microscopic Processing With FIB PDF Download
3.  Multi-Gas Supply System Application PDF Download
4.  Low Acceleration Mode Processing PDF Download
5.  High Magnification Observation PDF Download


Focused Ion Beam
SMI No.08
 Thickness Control Software PDF Download SMI No.08
SMI No.07
 Whiskers on copper frames with lead-free plating / Structural analysis of substrate interfaces Thermal Printer Head & Paper (Nanopics)
SMI No.06
 TEM sample preparation using angled processing Aluminum Circuit Board Polishing (Nanopics)
SMI No.05
 Eliminating FIB damage with a triple beam unit Grinding / Polishing Surface Shape Evaluation (Nanopics)
SMI No.04
 Nanomesh - A New Mesh for HRTEM Observation Thin Film Hardness Scale Indentation (Nanopics)
SMI No.03
 SIM Images of New Devices Disparity in Sueface Shape Due To Different Metal Dressing Process Conditions - Ball Bearing Groove - (Nanopics)
SMI No.02
 An Introduction to Cut & See Pro Liquid Crystal Display Production Process Evaluation (Nanopics)
SMI No.01
 LSI Flattening Techniques Using E-Gas and Auto Bitmap software Processing Surface Evalution Methods in Ultra-Precise Processing (Nanopics)


Focused Ion Beam System Top
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