XVision300, Hybrid FIB-SEM System

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Name

Hybrid FIB-SEM System

Type

XVision300

Overview Based on the high performance automation platform of SIINT´s SMI3000 series, this new product is equipped with the SIINT's latest FIB column and Gemini column of Carl Zeiss, achieving highly precise processing with less damage compared with conventional models, and 3nm SEM resolution.
XVision300, Hybrid FIB-SEM System