| Name |
Focused Ion Beam System |
| Overview |
The SMI4050 is the high performance Focused Ion Beam system. Equipped with
new optics, the SMI4050 provides world-leading SIM imaging resolution
and high definition TEM sample preparation by improved imaging resolution at
low kV.
The SMI4050 is delivered to meet a variety of applications such as cross
section observation, circuit modification, vector scan processing,
nano-micro patterning, nano molding, 3D nano fabrication using deposition
function, etc. |
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