| Overview |
The SPA-400 comes standard with AFM and MFM. Optional KFM, VE-AFM STM and other types of measurement can be performed through easy cantilever exchange. |
| Features |
• High rigid mechanical design protects against noise and vibration to achieve stable high-resolution measurements.
• Module type optical microscope (optional) simplifies all setup and sample positioning.
• Measurements can be performed easily even by first time users by utilizing the one-touch cantilever holder and position monitor for laser adjustment.
• Various Measurement Modes
• Atomic Force Microscope (AFM)
• DFM Mode (Atmospheric, in liquid)
• Friction Force Microscope (FFM)
• Phase Mode
• Magnetic Force Microscope (MFM)
• Lateral Force Modulation FFM (LM-FFM)
• Electro-chemical Atomic Force Microscope (EC-AFM)
• Visco-Elasticity Atomic Force Microscope(VE-AFM)
• Scanning Tunnel Microscope (STM)
• Kelvin Probe Force Microscope (KFM)
• Others |
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