| Name |
Fluorescent
X-ray Coating Thickness Gauge |
| Overview |
Advanced
x-ray microfocus technology has achieved high brilliance beam
with an actual beam size of less than 0.1mm in diameter. Consequently,
SFT9500 Series is capable of measurements of micro spots and
thin film applications, such as lead frames, connectors, and
flexible PCBs, that are difficult to measure with conventional
models due to in sufficient fluorescent X-ray intensity from
measurement samples. |
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| Features |
1.
Ultra Thin Film and Multilayered Film Measurement
Poly capillary, X-ray focusing optics system, enables micro
beam size of less than 0.1mm in diameter with high intensity
that is equivalent to 50 times that of conventional collimator
models in Au plating measurement. As a result, SFT9500 series
has a capability of quantitative measurement of single nano
meter of Au with high accuracy. Besides, it can simultaneously
measure each coating thickness of layer sin multilayered applications,
such as Au/Pd/Ni/Cu and Au/Ni/Ti/Si.
2.Mapping
Mapped image with micro beam is effective for the distribution
analysis of plating thickness and specific elements.
3. Hazardous Substance Analysis (for RoHS and ELV compliance)
SFT9500 provides the best solution for quantitative analysis
of hazardous substances. High resolution semiconductor detector
liquid nitrogen free is able to detect microelements. Examples
are Pb in Pb-free solder and electoless Nickel that are typical
component in Electric, Electronics, and Auto products.
4. Particle Analysis
High intensity micro beam combined with high count rate detector
makes possible of particle analysis. CCD camera can specify
particles, and then subtraction spectrum display functions
the qualitative analysis of the particles.
5. Data Editing Function
MS-EXCEL® is equipped with statistical processing function
that compiles measurement data as STDEV, Mean, Max, Min, CV,
and Cpk. MS-WORD® provides detailed measurement reports
with the sample image
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