SEA5120A, Micro Element Monitor
- Suitable for RoHS & ELV Analysis

Name Micro Element Monitor
Type SEA5120A
Overview Qualitative analysis of 50µm diameter micro parts and multiple element simultaneous quantitative analysis. Equipped with x-ray filters, allows measurement of hazardous substances restricted by WEEE and RoHS at high sensitivity. With a sample observation DDC microscope and X-Y-Z auto stage, analysis of microscopic areas and display output of mapping images of each element is possible. Functions are also provided for unknown substance analysis and coating thickness measurement.
Features 1. Standard equipped with round 0.1mm collimator making analysis of microscopic areas possible (minimum 25 µm)
2. Equipped with high resolution semiconductor detector and X-ray filter, making analysis and coating thickness measurement with high resolution and high accuracy at few ppm level possible.
3. Continuous measurement of designated point, as well as line analysis and mapping enabled using the CCD Camera and automatic stage
4. Can compare two spectrums, allowing easy extraneous substance analysis
5. Standard equipped with sample shape and thickness correction function that is essential for analysis of hazardous substance in plastic
6. Creates reports easily with single click operation.
SEA5120A Micro Element Monitor
Specifications
Measurement Element Na (5120A), C(5120AHTW) to U
Sample Shape Solid, Powder, Liquid
X-ray Tube Voltage: maximum 50kV, Current: maximum 1mA
Detector Si (Li) Semiconductor Detector
Dewer Capacity 10L
Analysis Area 0.1mmφ, 1mmφ, 2.5mmφ
Sample Observation CCD Camera
Filter 4 types: automatic switching
X-Y-Z Travel 75(W) x 75(D) x 35(H)mm
X-ray Station Desktop type PC, CRT
Sample chamber Standard Type (5100A, 5100 series)Large Type (5200 series)
Quantitative Software Calibration method (bulk, thin film)
FP method (bulk, thin film)  
Software Qualitative, HS Easy (option), Spectrum matching (option)  
Data Process software MS-Excel®, MS-Word ®
Power Supply AC100V, 10A
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