| Measurement Element |
Na~U |
| Sample Shape |
Solid, Powder, Liquid |
| X-ray Tube |
Voltage: maximum 50kV, Current: maximum 1mA |
| Detector |
Voltex Si Semiconductor Detector (No NH2 required) |
| Analysis Area |
3mmφ, 8mmφ :automatic switching |
| Sample Observation |
CCD Camera |
| Filter |
5 types: automatic switching |
| Sample Chamber |
430(W) x 320(D) x 200(H) mm |
| Sample Changer |
12 samples (option) |
| X-ray Station |
Laptop |
| Quantitative Software |
Calibration method (bulk, thin film), FP method (bulk, thin film) |
| Software |
Qualitative, HS-Easy (option) |
| Data Process Software |
MS-Exce®, MS-Word® |
| Power Supply |
AC 100V to 120V, 200V to 240V, 10A |
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