| Detection
System |
Light reflection
system |
| Optical System |
Low coherence
optical system |
| Scanning
system |
Accurate
scanner (Vertical Z-axis), Closed loop scanner with internal
triaxial sensor |
| Resolution |
Horizontal:
0.5 nm Vertical: 0.01 nm |
| Sample Size |
Diameter:
150 mm (6 inches), thickness: 22 mm; Diameter: 200 mm (8 inches),
thickness: 12 mm |
| Stage Mechanism |
High accuracy
motorized stage
X: ±75mm
Y: +105, -5mm
Z: 22mm (6 inches), 12 mm (8 inches) |
| Scan Range |
90 µm |
| Optical microscope
(Optional) |
High magnification
mode: Approximately 270 to 1100 times (9 inches monitor),
0.2 to 0.8 mm (diagonal)
Low magnification mode: Approximately 155 to 620 times (9
inches monitor), 0.35 to 1.4 mm (diagonal) |
| Functions |
AFM, FFM,
DFM, PM (standard)
SIS, LM-FFM, VE, Adhesion, CURRENT, SSRM, PRM, KFM, SMM (optional) |
| Other features
|
Automatic
cantilever exchange
Automatic cantilever diagnostics (optional)
Recipe registration for automatic measurement
Supports SIS mode (optional)
Cantilever evaluationAutomatic cantilever exchange
Automatic cantilever diagnostics (optional)
Recipe registration for automatic measurement
Supports SIS mode (optional)
Cantilever evaluation |
|
|