August 1, 2007

Launch of the SFT9550 High-Performance Fluorescent X-Ray Coating Thickness Gauge
Supporting the high-precision measurement of film thickness of large printed circuit boards, electronic parts.

SII NanoTechnology Inc. has released the SFT9550, a fluorescent X-ray coating thickness gauge for measuring the thickness of metal plating, deposition, etc. of large printed circuit boards, electronic parts and the like with high precision as of today, August 1.

Measuring and controlling the coating thicknesses and composition of metallic thin films of plating, deposition and suchlike used in semiconductors, electronic components and printed circuit boards is critical in guaranteeing the functions, quality and cost of the products. These plated products are required to have a high degree of functionality, and becoming increasingly miniaturized and thinly plated. Under these conditions, there is a market requirement to measure thin films with precision in the order of nanometers. In addition, the regulations concerning hazardous substances, as exemplified by the RoHS directives, are increasing the necessity of composition analysis in such ultra-thin platings and micro spot.

The newly released SFT9550 is a product equipped with a stage supporting large specimens of up to 400(X) x 300(Y) x 45(Z) mm, in response to the needs for the measurement of large printed circuit boards or automatic measurement of several specimens in the coating thickness measurement market. Large printed circuit boards, wafers, etc. that were once required to be cut to adjust to the size of the sample stage can be measured as they are. While retaining the highly precise coating thickness measurement and micro part analysis functions of the SFT9500 for coating thickness measurement in ultra-thin plating, vapor deposition, etc. well-reputed since the release in May, 2006, it became possible to reduce the pretreatment for measuring large specimens.

Like the SFT9500, the SFT9550 can perform not only the coating thickness measurement of plated products, but also the qualitative and quantitative analysis of environmentally restricted substances such as lead in micro spots of electric products, automobile products, and such.

SII NanoTechnology Inc. is planning to expand sales focusing on the electronic and electrical equipment and component manufacturers as well as auto manufacturers.

[Main Features]

1. Measurement of large specimen Loaded with a large stage, a large specimen (up to 400(X) x300 (Y) x45 (Z) mm), which could not be measured conventionally without having it cut, can be measured as it is. Moreover, many small specimens can be arranged on the stage and automatically measured continuously.

2. Measurement of thin plantings/multi-layered plantings The thickness of each layer for multi-layers (gold / palladium / nickel / copper material or gold / nickel / titanium / silicon wafer) in the field of semiconductors and electronic parts can be measured simultaneously at the level of several nanometers. With the high-intensity of the micro beam (diameter of 0.1mm) by adopting an X-ray collecting system (capillary), the X-ray is detected with the intensity of up to 50 times compared with the conventional models, and the thin plating is measured with high precision. Measurements of micro spots and thin platings, such as lead frame, connector and flexible substrate, etc., can be performed.

3. Mapping function The mapping function using the micro beam makes it possible to easily and quickly observe the distribution of the plating thickness of the sample, as well as the distribution of specific elements therein. In particular, it is effective to check a lead-free soldering part in the mounting board.

4. Analytical function Equipped with "Vortex," a liquid nitrogen-free semiconductor detector with a high counting rate and high resolution, the qualitative and quantitative analysis of an unknown specimen can be conducted. Furthermore, a foreign body can be analyzed by the micro beam.

5. Data editing functions Microsoft Excel and Microsoft Word are installed as standard. Microsoft Excel is equipped with statistical processing functions that enable statistical processing of measured data, average values, maximum and minimum values, C.V. values, Cpk, etc. Microsoft Word makes it possible to easily create reports on the results of measurements, including the sample image.

[Price] 14,900,000 yen (tax excluded)

[Sales Start Date] August 1, 2007

[Sales Target] 20 units in FY2007

High-Performance Fluorescent X-ray Coating Thickness Gauge SFT9550

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