What's New 2008 | SII NanoTechnology Inc.

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12/03/2008	SII NanoTechnology Releases “SIR-5”, Photomask Defect Repair System
06/17/2008	Launch of the SEA6000VX Fluorescent X-ray Analyzer equipped with High-Speed Mapping Measurement Function
05/20/2008	The ULTRA plus, a scanning electron microscope by Carl Zeiss SMT