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Top >  What's New > 2007 08/01/2007 Launch of the SFT9550 High-Performance Fluorescent X-Ray Coating Thickness Gauge 07/26/2007 SII NanoTechnology Strengthens its Overseas Fluorescent X-ray Analysis Business 04/17/2007 SII NanoTechnology Releases SIR-7, a Photomask Defect Repair System for 45-nm Nodes 04/27/2007 SIINT Announces Changes in Management Latest News