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Subsidiary
Testing Laboratories
 Testing Laboratory (Physical Testing)

The value of thin platings measured with fluorescent X-ray coating thickness gauge needs verification of its correctness. According to ISO16949, it is necessary that corrections of instruments and standard samples are conducted by accredited testing laboratories. SII NanoTechnology was accredited as testing laboratory compliant with ISO/IEC17025 in October 2002 by The Japan Accreditation Board for Conformity Assessment (JAB), and provides internationally accredited test result since then. The scope of the achieved accreditation is Fluorescent X-ray Measurement based on the Gravimetric Method of thickness Measurement in Mechanical and Physical Testing stated by JAB. Certification by JAB
  ↑ Certification by JAB

Accredited values of major thin plaiting
Element Lower
Limit(µm)		 Higher
Limit(µm)
Element Lower Limit(µm) Higher Limit(µm)
Ti 0.1 15
Ni 0.1 35
Cu 0.1 40
Zn 0.1 40
Pd 0.1 20
Ag 0.1 70
Sn 0.1 70
Pt 0.05 7
Au 0.05 7
Pb 0.1 15
Plating Lower Limit(µm) Higher Limit(µm)
Zn on Fe 0.1 40
Ag on Cu 0.1 70
Sn on Cu 0.1 70
. . .
. . .
[ Contact ]
About Testing Laboratories:
Physical Testing Laboratory  
TEL: +81-550-76-3397
Chemical Testing Laboratory
TEL: +81-3-6280-0068
About purchase of standard samples:
Epolead Service Inc.
TEL: +81-3-5540-7300
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